Industry News: xrf (Page 1 of 6)

SMTA China Presents Seven Best-Paper Awards at SMTA China South 2009 Conference

Industry News | 2009-09-03 12:06:15.0

SMTA China announces that it presented awards for seven papers at the SMTA China South 2009 Conference Award Presentation Ceremony, held on Thursday, August 27, 2009 at the Shenzhen Ritz-Carlton Hotel in conjunction with the SMTA Hong Kong Chapter Annual Breakfast Reception.

Surface Mount Technology Association (SMTA)

SMTA Capital Chapter June 20th Meeting to Feature Presentation on “Counterfeit Components”

Industry News | 2012-05-15 11:14:08.0

Tom O’Connor, DFR Solutions, will present a paper on the topic of counterfeit components.

Surface Mount Technology Association (SMTA)

Join the SMTA Capital Chapter’s June Meeting and Counterfeit Component Presentation

Industry News | 2012-05-23 17:07:02.0

During this second meeting of 2012, Tom O’Connor, DFR Solutions, will present a paper on the topic of counterfeit components.

Surface Mount Technology Association (SMTA)

Join the SMTA Capital Chapter’s June Meeting and Counterfeit Component Presentation

Industry News | 2012-05-30 14:19:52.0

Tom O’Connor, DFR Solutions, will present a paper on the topic of counterfeit components.

Surface Mount Technology Association (SMTA)

Volunteers Honored for Contributions to IPC and the Electronics Industry Seventy-Five Awards Presented at Fall Standards Development Committee Meetings

Industry News | 2016-09-29 20:30:17.0

IPC – Association Connecting Electronics Industries® presented Committee Leadership, Special Recognition and Distinguished Committee Service Awards on September 26 at IPC's Fall Standards Development Committee Meetings in Rosemont, Ill. The awards were presented to individuals who made significant contributions to IPC and the industry by lending their time and expertise in the development of electronics manufacturing standards.

Association Connecting Electronics Industries (IPC)

Circuit Technology Center Commissions New XRF X-ray System

Industry News | 2021-08-13 08:37:00.0

Circuit Technology Center announces that it has recently purchased and commissioned an Oxford 980 X-Strata series XRF (x-ray fluorescence) system to support the testing of electronic components for restricted substances such as lead or tin above specified limits. The system can also verify the coating thickness. Defense base customers often require XRF verification testing of components after components have been processed through lead-free to leaded solder alloy exchange for tin mitigation applications. XRF testing may also be required to verify RoHS compliance of components that have been re-balled or re-processed for lead-free applications. In addition to XRF testing, Circuit Technology Center also supports ionic cleanliness testing, X-ray, Acoustic Microscopy, Solderability, and BGA ball shear testing services.

Circuit Technology Center, Inc.

Hitachi FT150 Micro-XRF Added at Eastern Applied Research

Industry News | 2016-12-27 09:47:52.0

The addition of a Hitachi FT-150 Micro-XRF analyzer allows Eastern Applied to provide third party testing of ultra thin films plus additional thickness measurements and composition analysis. The Hitachi FT-150 will also be available for demonstrations to North American facilities looking to add Micro-XRF analysis for process control.

Eastern Applied Research Inc.

RMD Instruments to Exhibit LeadTracer-RoHS System at Mexitr�nica 2007

Industry News | 2007-10-08 23:17:23.0

WATERTOWN, MA - October 8, 2007 - Devoted to the development of new radiation detector and systems technology, RMD Instruments LLC announces that it will demonstrate its innovative LeadTracer-RoHS XRF system, with new sample preparation stand in booth 500, at the upcoming Mexitr�nica exhibition, scheduled to take place October 23-25, 2007, at the Expo Guadalajara, Hotel Hilton, in Guadalajara, Jalisco, M�xico.

RMD Instruments

RMD Instruments to Showcase LeadTracer-RoHS System at Nepcon East 2007

Industry News | 2007-10-23 15:39:35.0

WATERTOWN, MA - October 23, 2007 - Devoted to the development of new radiation detector and systems technology, RMD Instruments LLC announces that it will highlight its innovative LeadTracer-RoHS XRF system, with new sample preparation stand, in its representative Precision Automation & Assembly�s booth 815 at the upcoming Assembly New England/Nepcon East exhibition and conference scheduled to take place October 30-31, 2007 at the Boston Convention & Exhibit Center.

RMD Instruments

LeadTracer-RoHS System Now with Sample Preparation Stand at Productronica 2007

Industry News | 2007-11-01 02:24:59.0

RMD Instruments LLC, leading developers of radiation detector and systems technology will demonstrate its innovative LeadTracer-RoHS XRF system, with new sample preparation stand, in hall A4, booth 339 at the upcoming Productronica 2007 exhibition and conference scheduled to take place November 13-16, 2007 at the New Munich Trade Fair Center in Munich, Germany.

RMD Instruments

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