SMT Express, Volume 5, Issue No. 3 - from SMTnet.com Machine Capability Measurement on SMT Equipment by Romain Schmitt, Jean Marie Guillet - Solectron Technology, Inc. Introduction by Michael Sivigny of EAGLE-EYED ONE
The Relationship between Backward Compatible Assembly and Microstructure on the Thermal Fatigue Reliability of an Extremely Large Ball Grid Array SMTnet Express June 22, 2012, Subscribers: 25283, Members: Companies: 8903, Users: 33267
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