The Relationship between Backward Compatible Assembly and Microstructure on the Thermal Fatigue Reliability of an Extremely Large Ball Grid Array SMTnet Express June 22, 2012, Subscribers: 25283, Members: Companies: 8903, Users: 33267
Void Detection in Large Solder Joints of Integrated Power Electronics SMTnet Express December 6, 2012, Subscribers: 26051, Members: Companies: 9064, Users: 34032 Void Detection in Large Solder Joints of Integrated Power Electronics by: Patrick
large variety of polymer materials with different
