412 open due to coplanarity results

Detection of Bare PCB Defects by Image Subtraction Method using Machine Vision

SMT Express, Volume 2, Issue No. 2 - from SMTnet.com

PCB Dynamic Coplanarity At Elevated Temperatures

PCB Dynamic Coplanarity At Elevated Temperatures PCB Dynamic Coplanarity At Elevated Temperatures iNEMI's SMTAI 2011 presentation by: John Davignon, Ken Chiavone, Jiahui Pan, James Henzi, David Mendez, Ron Kulterman; Intel Corporation

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SMT Line Improvements for High Mix, Low Volume Electronics Manufacturing

SMT Express, Issue No. 4 - from SMTnet.com

SMT Express, Volume 3, Issue No. 5 - from SMTnet.com

Comparing techniques for temperature-dependent warpage measurement

SMT Express, Volume 2, Issue No. 4 - from SMTnet.com

SMT Express, Issue No. 5 - from SMTnet.com