SMTnet Express, December 1, 2016, Subscribers: 27,507, Companies: 15,035, Users: 41,441 Review of Interconnect Stress Testing Protocols and Their Effectiveness in Screening Microvias Edward Arthur; Raytheon , Charles Busa, Wade Goldman P.E., Alisa
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Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages Drop Impact Reliability of Edge-bonded Lead-free Chipscale Packages This paper presents the drop test reliability results for edge-bonded 0.5mm pitch lead-free chip scale
