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NF120(200 nano resolution) X-ray Inspection System

NF120(200 nano resolution) X-ray Inspection System

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#Xray#Inspection#SEC Nano-focus Tube of 200 nano resolution which is specialized for sub-micron defects of Semiconductor Packaging, Wafer Level Packaging(WLP). -Non-destructive Analysis System -High-Resolution Image with Dual Type CTs -Application

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