Technical Articles From ZN Technologies
Read technical articles about electronics manufacturing added by ZN Technologies
- SMTnet
- »
- Technical Library
- »
- Contributors
- »
- Articles from ZN Technologies
1 technical article added by ZN Technologies
Company Information:
Projection Moiré vs. Shadow Moiré for Warpage Measurement and Failure Analysis of Advanced Packages
Jan 31, 2013 | Joe Thomas
There are three key industry trends that are driving the need for temperature-dependent warpage measurement: the trend toward finer-pitch devices, the emergence of lead-free processing, and changes in device form factors. Warpage measurement has become a key measurement for analysis; prevention and prediction of interconnect defects and has been employed in failure analysis labs and production sites worldwide. First published in the 2012 IPC APEX EXPO technical conference proceedings...