Electronics Manufacturing Training

Technical Articles From Teradyne

Read technical articles about electronics manufacturing added by Teradyne

5 technical articles added by Teradyne

Company Information:


Teradyne is a leading supplier of Automatic Test Equipment used to test semiconductors, wireless products, data storage and complex electronic systems which serve consumer, communications, industrial and government customers.

North Reading, Massachusetts, USA

Inspection, Test Services

  • Phone +1/ 978 370-2700

Teradyne website

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(8) products in the catalog

(5) technical library articles

(29) news releases

Comparing Costs and ROI of AOI and AXI

Aug 07, 2013 | Peter Edelstein, Teradyne

PCB architectures have continued their steep trend toward greater complexities and higher component densities. For quality control managers and test technicians, the consequence is significant. Their ability to electrically test these products is compounded with each new generation. Probe access to high density boards loaded with micro BGAs using a conventional in-circuit (bed-of-nails) test system is greatly reduced. The challenges and complexity of creating a comprehensive functional test program have all but assured that functional test will not fill the widening gap. This explains why sales of automated-optical and automated X-ray inspection (AOI and AXI) equipment have dramatically risen......

Principles of Analog In-Circuit Testing

Dec 26, 2012 | Anthony J. Suto, Teradyne

Passive components including resistors, capacitors, inductors, and circuit-protection devices compose the highest percentage of all devices that are populated on today’s PCB assemblies. However, the successful isolation and testing of these components during ICT is perhaps the most challenging and the least understood of all modern-day validation practices....

Issues and Challenges of Testing Modern Low Voltage Devices with Conventional In-Circuit Testers

Dec 14, 2012 | Alan J. Albee

The popularity of low voltage technologies has grown significantly over the last decade as semiconductor device manufacturers have moved to satisfy market demands for more powerful products, smaller packaging, and longer battery life. By shrinking the size of the features they etch into semiconductor dice, IC manufacturers achieve lower costs, while improving speed and building in more functionality. However, this move toward smaller features has lead to lower breakdown voltages and increased opportunities for component overstress and false failures during in-circuit test....

Designing PCBs for Test and Inspection

Dec 14, 2012 | Michael J. Smith, Teradyne

This article provides practical and affordable Design-for- Test (DFT) and Design-for-Inspection (DFI) methods that will have a positive impact on product costs, yield, reliability, and time-to-market. The properties of testability (including controllability and observability) will be analysed as they relate to analogue and digital design rules and their cause/effect, as well as the electrical and physical characteristics of proper PCB design....

Virtual Access Technique Augments Test Coverage on Limited Access PCB Assemblies

May 03, 2012 | Anthony J. Suto

First published in the 2012 IPC APEX EXPO technical conference proceedings. Increased pressures to reduce time to market and time to volume have forced many manufacturers of populated printed circuit boards to rely on capacitively coupled, un-powered, vec...

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