Testing To Eliminate Reliability Defects From Electronic Packages
Published: |
June 29, 2006 |
Author: |
Irving Memis, Consultant, Endicott Interconnect Technologies |
Abstract: |
Electronic Packaging is a critical part of all electronic devices and can be a source of the reliability problems experienced by systems using those devices. In many cases, the packaging defects are intermittent in nature and difficult to detect. This paper describes a tester that has been used for 20 years on commercial products and has proven to be extremely effective in detecting these defects prior to component assembly.... |
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