Test Research (TRI) TR5001E
Model: |
Test Research (TRI) TR5001E |
Category: |
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Model Year: |
2012 |
Condition: |
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Location: |
Mexico |
Offered by: |
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Contact SMTUNION |
Fealures
• Modular upgrade options from MDA to ICT and functional test
• High fault coverage test solution
• Limited access solution and functional test expansion using PXI modules
• Friendly UI with fast and easy program development
Tester Specifications
Analog/hybrid test points: 3200 analog or maximum digital test points: 1600
Operating System: Microsoft® Windows compatible PC, Windows 7-10
Fixture Type: Offline press type fixture
Analog Test Hardware
6-wire measurement switching matrix
Programmable AC/DC/DC High voltage and current sources
AC/DC voltage, DC current measurement, frequency
Component R/L/C measurement
Analog Hardware
TestJet vectorless open circuit detection
Arbitrary Waveform Generator
Digital Testing
Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
DUT power supplies: 5 V@3 A, 3.3 V@3 A, 12 V@3A, -12 V@1 A and 24 V@3 A
Programmable DUT power supplies: 75 V / 8 A max, 200W maximum output power
Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
On-board Flash, EEPROM, MAC programming
Max PCB Size
Standard: 420 x 300 mm
Option: 500 x 350 mm or larger