SMT & PCB Assembly Equipment

Agilent HP-Agilent E5052A-810-820

Agilent HP-Agilent E5052A-810-820

Agilent HP-Agilent E5052A-810-820


Agilent HP-Agilent E5052A-810-820


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Agilent E5052A-810-820

The Agilent E5052A Signal Source Analyzer (SSA) is a new class of instrument that can evaluate the critical performance characteristics of nearly all types of RF and microwave signal sources. Agilent's goal in creating the SSA was to offer a single instrument that would significantly speed measurement times, and help R&D and manufacturing engineers in the wireless communications, broadband optical, aerospace/defense and electronics industries perform tests more accurately, and with unprecedented simplicity. The SSA also significantly lowers cost by eliminating the need to purchase multiple standalone instruments. While the SSA follows the tradition of Agilent's popular 4352S VCO/PLL Signal Test System, which is designed to characterize voltage-controlled oscillators (VCOs) and PLL synthesizers, it addresses the limitations of the 4352S and offers new test capabilities that enable evaluation of a much broader range of signal source types. Comprehensive Capabilities The Agilent E5052A SSA makes four types of measurements:

    Frequency, power and DC current

    Transient measurements (frequency, phase and power versus time)

    Spectrum monitor

    Phase noise

The SSA has been designed to meet or exceed current and anticipated requirements for each measurement type. Frequency, power and DC current tests are facilitated by simultaneously measuring frequency, RF power and DC current consumption. DC tuning (control) voltage and DC power sweeps enable a variety of measurements, including:

    Tuning sensitivity (frequency versus DC tuning voltage)

    Frequency pushing (frequency versus DC power voltage)

    RF power versus either DC tuning voltage or DC power voltage

    DC current consumption versus either DC tuning voltage or DC power voltage

Two internal DC sources for device-under-test (DUT) power and control voltages are optimized for use with signal sources, which are very sensitive to noise on either tuning voltage or power voltage lines. Either DC control or power voltage can be swept with the result displayed on the instrument's LCD. There is no need to control the voltages with an external PC. For versatile transient measurements that are necessary for characterizing PLL synthesizers and transmitters, the SSA employs frequency and phase demodulation as well as power measurements. Frequency, phase and power transients are simultaneously measured in heterodyne (narrowband) mode and direct (wideband) mode. Wideband mode is also available for wide frequency transient to enable designers to see more overall transient phenomenon. An external hardware trigger is accommodated by a rear-panel interface, and video and pre-trigger events can be observed before and after an event. Fine resolution is maintained even at the instrument's highest sample rate of 10 ns. The instrument's spectrum monitor function facilitates measurement of reference signal leakage (spurious) around the carrier and is useful because the signal source does not need to be reconnected. Phase Noise Measurement Breakthrough The E5052A SSA uses Agilent's proprietary cross correlation technique, which allows very low phase noise levels to be measured at all offsets from the carrier frequency without reducing measurement speed or compromising phase measurement performance. Cross correlation can remove the limitation posed by the noise floor of the reference source, while also lowering the usable noise floor by up to 20 dB. Cross correlation reduces the dependency of the measurement on low input power versus the available noise floor. The cross correlation technique essentially cancels noise by employing two channels that have independent reference sources and through digital signal processing (DSP). If two signals are correlated and vector summed, the vector (amplitude and phase) of the two signals is emphasized. However, if two signals are uncorrelated, their vector sum is canceled, so the internal noise from references such as sources, analog-to-digital converters and mixers can be canceled. The amount of noise cancellation depends on the "number" of correlation and is based on root N (the number of correlation). Correlation of 10 times produces a 5 dB noise floor improvement, and 100 times correlation produces a 10 dB improvement. The cross correlation technique traditionally has suffered from one primary limitation. It increased measurement time for data capture and computation, which itself depends on the difference between the phase noise of the DUT and that of the internal reference source. The SSA has solved this problem so that engineers can take advantage of the benefits of the technique. The instrument reduces measurement time by using a high-performance, 100 MHz (10 ns) digital-to-analog converter with a stepped Fast Fourier Transform (FFT) implemented with DSP. The Agilent E5052A Signal Source Analyzer is a complete measurement solution for all types of signal sources. The SSA reduces the limitations of earlier multifunction instruments or "rack-and-stack" assemblages of instruments, and offers the advantage of not being limited to measuring only current devices. To achieve this, all major tests are performed at the highest achievable levels of performance, and the DUT is provided with a clean DC source. The SSA also works with external down converters that currently extend the top frequency range to 110 GHz. This feature helps ensure the SSA will not be limited by frequency in the future. Key E5052A Specifications Carrier frequency range: 10 MHz to 7 GHz (110 GHz with down converters) Tests performed: Phase noise, frequency, power, DC current, spectrum monitor and frequency/power/phase transients Phase noise test:

    Offset frequencies: 1 Hz to 40 MHz

    Phase noise sensitivity: >-178 dBc/Hz

    Noise floor lowering method: Two-channel cross correlation

Frequency and power test:

    Parameters: Frequency and power

    Sweep type: DC power voltage or DC control voltage

Transient tests:

    Parameters: Frequency, phase, and power versus time

    Frequency resolution: 5 Hz to 7 kHz (Heterodyne mode)

    Time resolution: 10 nanoseconds to 160 microseconds

    Frequency transient range: (Heterodyne mode) 1.6 to 25.6 MHz

    Pretrigger capability: Direct mode: 4.8 GHz max; -80% of time span or +1 s

DC tests:

    Parameters: DC current (DUT power only)

    Voltage/current range: Control: -15 to +35 VDC, 20 mA max; DUT power: 0 to +16 VDC, 80 mA max

The E5052B is the replacement product. - See more at:

Company Information:

The Worlds Largest Distributor of New, Refurbished, and Second Hand Electronic Test and Measurement (T&M) Equipment.

Lake Mary, Florida, USA

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  • Phone 407-804-1299
  • Fax 407-804-1277

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