Agilent E5061B

Agilent E5061B

Agilent E5061B


Agilent E5061B


In-Circuit Testers

Model Year:






Offered by:

Shenzhen jiahuijie technology Co,;Ltd


The E5061B-010 time domain/fault location analysis option allows you to locate the discontinuities and mismatches of devices such as cables. By employing the gating function in the time domain and transforming the data back to the frequency domain, you can remove unwanted responses of connector mismatch in your fixture. In addition, the cable SRL (Structural Return Loss) analysis capability is provided with the E5061B-010.

Key Features & Specifications

•Up to 1,601 point measurement with low-pass and band-pass modes

•Gating function to remove unwanted fixture effects

•Window function

•Accurate vector error calibration at the tip of the test port

•X-axis unit in seconds, meters, and feet

•Structural return loss analysis

Company Information:

Shenzhen jiahuijie technology Co,;Ltd

Shenzhen jiahuijie technologies Co.,ltd is one of the leading test and measuring instruments provider in Asia relying on a stable supply of foreign channels. We carry a full range of used test equipm

Shenzhen, China

Equipment Dealer / Broker / Auctions

  • Phone 86+75586641139
  • Fax 86+75586641139

Shenzhen jiahuijie technology Co,;Ltd website

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This Agilent E5061B has been added in 29 Aug 2012

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