Agilent E5061B

Model:	Agilent E5061B
Category:	In-Circuit Testers
Model Year:	2006
Condition:	used
Location:	China
Offered by:	Shenzhen jiahuijie technology Co,;Ltd
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Description

The E5061B-010 time domain/fault location analysis option allows you to locate the discontinuities and mismatches of devices such as cables. By employing the gating function in the time domain and transforming the data back to the frequency domain, you can remove unwanted responses of connector mismatch in your fixture. In addition, the cable SRL (Structural Return Loss) analysis capability is provided with the E5061B-010.

Key Features & Specifications

•Up to 1,601 point measurement with low-pass and band-pass modes

•Gating function to remove unwanted fixture effects

•Window function

•Accurate vector error calibration at the tip of the test port

•X-axis unit in seconds, meters, and feet

•Structural return loss analysis