Feb 15, 2009 Agilent's presentations will follow two tracks. Please visit the website for each stop's agenda as not all papers are presented at every stop.
The following are the tracks and paper topics:
Session/Track 1: State of the Art Design and Parametric Test Solutions
(Not all papers will be presented at every stop please check your site for details)
- A New Approach to Embedded LO Testing
- High Performance Noise Figure Measurements
- Advanced Nonlinear Device Characterization Utilizing New Nonlinear Vector Network Analyzer and X-parameters
- System Interoperability Modeling and Simulation Using Agilent Advanced Design System for RADAR and SatCom Applications
- Combining FPGAs and RF for SDR OFDMA PHY Waveform Development
- N5264A PNA-X Measurement Receiver (Firefly)
Session/Track 2: Innovative RADAR, RF Microwave and Broadband Test & Measurement Tools (Not all papers will be presented at every stop please check your site for details)
- Signal Simulation and Analysis of Modern Radars Revealed
- Modern Pulsed Carrier Measurement Techniques
- Creating a COTS Based Multi-Channel Wideband Measuring Receiver
- Analyzing Wideband RADAR and SATCOMM Signals
- Improving Signal Integrity and Reducing Measurement Uncertainty in Custom Switch Matrices
- High Performance Arbitrary Waveform Generation for RADAR and LIDAR Application
- Testing Low Noise Components in Pulsed and Moving Target Radars
When:
Feb 23, 2009, Freemont, CA
Feb 24, 2009, El Segundo, CA
Feb 26, 2009, Tucson, AZ
Mar 10, 2009, Andover, MA
Mar 11, 2009, Princeton, NJ
Mar 17, 2009, Columbia, MD
Mar 18, 2009, Herndon, VA
Where: For further details and registration: http://agilent.distributech.ca/registration.asp?seminarid=212
