Jan 20, 2003
The course will be taught by David Douthit, who has consulted for over 30 years in the troubleshooting, repair and failure prevention of electronic circuitry and systems.
Participants will realize the potential cost savings of highly accelerated life testing (HALT) that combines contamination with traditional testing protocols. The course will enable participants to generate more realistic test data needed for (1) predicting long-term reliability and for (2) predicting warranty/infant mortality.
Details are available from Equipment Reliability Institute (ERI), phone 805/564-1260, FAX 805/966-7875, 1520 Santa Rosa Ave., Santa Barbara, CA 93109. Also at http://www.equipment-reliability.com/course2.htm. Instructor Douthit welcomes questions about the course.
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