Teradyne Introduces LitePoint RF Instruments for J750 Wireless Test Solution

J750-LitePoint Solutions Lower Test Costs for Wireless Connectivity and RF SOC Devices

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, Inc. (NYSE: TER), a market leader in wireless device test, introduced its latest wireless test solution for the J750 test platform. This expands Teradyne's market-leading position by introducing LitePoint's IQxel-M8, IQxel-M and IQxstream instrument options for the J750. These options enhance the J750's test economics by further expanding its instrument portfolio and by leveraging the more than 4,000 750 family systems deployed worldwide. Teradyne has received orders from multiple customers for this next generation wireless test solution and it is currently in production at multiple manufacturing sites.

The J750-LitePoint solution addresses the technical and economic challenges of testing wireless connectivity and other RF SOC devices. Following the double digit growth of wireless enabled System-on-a-Chips, these instrument options provide the scalability and parallel test efficiency required to achieve lowest cost of test in high volume production. The solutions provide up to 32 independent RF ports for testing high device site counts. The system can be configured to run key RF performance tests such as error vector magnitude (EVM) for the latest connectivity and cellular modulation standards, leveraging LitePoint's RF measurement science. In addition, the product expands the J750 processing capability to achieve shorter test times by making use of LitePoint's dedicated DSP processor for backgrounding all RF computations. The LitePoint IQxel-M8, IQxel-M and IQxstream instrument options are offered with new J750 orders or as an upgrade to any existing system.

"Teradyne's J750 has been recognized as the leading solution for microcontroller, FPGA and digital audio/baseband testing, and now, with the addition of RF instrumentation, we further extend its value to our customers," said Jason Zee, Consumer and LPA Business Unit Manager at Teradyne. "The continued integration of wireless connectivity technology onto microcontrollers and other mobile devices requires production test equipment that can deliver the added RF measurement performance and still achieve a low cost of test. J750-LitePoint was designed to address this challenge."