MIRTEC Wins a 2009 Global Technology Award at Productronica

OXFORD, CT — November 2009 — MIRTEC announces that it has been awarded a second consecutive Global Technology Award in the category of Inspection-AOI Systems. The award was presented to MIRTEC for their Technologically Advanced MV-3L Desktop AOI System.

The award ceremony took place on Tuesday, November 10, 2009 at the New Munich Trade Fair Center in Munich, Germany.

The MIRTEC MV-3L Desktop AOI System is the industry’s most widely accepted Five Camera Desktop AOI system.  Fully configured the MV-3L provides a Five Mega Pixel top down Telecentric camera with an incredible 9.8 micron/pixel resolution and four Five Mega Pixel side-view cameras

The MV-3L also features MIRTEC’s revolutionary Intelli-Beam Laser Inspection System. This system provides the “The Third Dimension” in inspection capability, the ability to precisely measure the Z-height of a given region of interest. This advanced technology provides four-point height measurement capability for co-planarity testing of BGA and CSP devices as well as enhanced solder paste measurement capability.

Premiering in 2005, the Global Technology Awards program is an annual celebration of product excellence in electronics surface mount assembly. Premier products based on the finest examples of creative advancement in technology are chosen by a distinguished panel of industry experts.

MIRTEC is a leading global supplier of automated inspection systems to the electronics manufacturing industry. The company manufactures technologically advanced AOI, SPI and X-Ray systems designed to provide unprecedented performance, quality and cost-effectiveness to the inspection environment. For more information please visit: http://www.mirtecusa.com.