SMT, PCB Electronics Industry News

LCR-Reader-MPA Makes Debut at Nepcon 2019

Jun 28, 2019

Siborg showed the first look at the new LCR-Reader-MPA at Nepcon (EMK) in Korea in May. Siborg has previously debuted the LCR-Reader and LCR-Reader-MP in 2014 and 2017 respectively.

"This was our first presentation of the newly completed LCR-Reader-MPA," says the Director of Siborg, Michael Obrecht. "We have shown devices in the past to welcoming audiences. Our multimeteres are well received by consumers for their ease-of-use and high accuracy. LCR-Reader-MPA combines the best of all our devices with a higher basic accuracy of 0.1% and more features, including more test frequencies. The showing went well - people were very receptive. We got a lot of feedback from people, mostly about the wide range of applications and high accuracy. I would say it was a success."

Electronic Manufacturing Korea (EMK Nepcon) has become a globally renowned exhibition for domestic and foreign buyers ad is Korea's largest electronics manufacturing exhibition.

LCR-Reader-MPA is a powerful multimeter with sharp-gold plated tips and the ability to test SMT with no set-up. The device will automatically determine the type of component and best test parameters before displaying all measurement data. 

The MPA sets itself apart from traditional multimeters with higher accuracy and more features. In addition to automatic and manual LCR- and ESR- measurements, the MPA offers testing such as: AC/DC voltage measurements, LED/diode, short/continuity, signal generator, oscilloscope mode, and frequency measurements. 

The wide range of test frequencies, including 100 kHz, allow for a wide range of applications. Being able to test at 100 kHz allow the device to have a 0.1 nH resolution for inductances and 0.001 pF resolution for capacitances. 

The oscilloscope mode allows users to test voltage waveforms on active circuit boards with frequecy up to 100 kHz. This mode is usefull when used with the LCR-Reader Kelvin Probe Connector, which turns any LCR-Reader, MP, MPA or Smart Tweezers device into a low-frequency probe station.

MPA has a Large and Super Large Capacitance measurement mode up to 680mF, due in part to the wide range of test frequencies (100, 120 Hz, 1, 10, 20, 30, 40, 50, 60, 75, and 100 kHz). Electrolytic capacitors are measured at 120 Hertz while ESR is measured at 100 kHz according to regular electrolytic capacitor test conditions.

The main differences between the older MP model and the new MPA is the size of the device; MPA is roughly 1.5 times lighter than the MP at 30 grams. The jog-wheel navigation was replaced with a 4-way joystick-like button which allows users to change basic test functions from the measurement screen. The device now offers three test signal levels: 0.1, 0.5 ad 1.0 Vrms. The ability to test at 1 Vrms is important for accurately measuring ceramic capacitors. LED testing was increased to 3.2 Volts and the signal source resistance was reduced to 100 Ohms allowing for better test results while measuring smaller resistances and larger capacitances.

Features on LCR-Reader-MPA:

  • Fully automatic and manual LCR, ESR, LED/Diode measurements
  • 0.1% Basic accuracy
  • Automatic and maual test frequencies, 100, 120 Hz, 1, 10, 20, 30, 40, 50, 60, 75, and 100 kHz
  • Easy Open/Short calibration and offset removal
  • Test signal levels of 0.1, 0.5 and 1.0 Vrms
  • AC/DC voltage measurements up to 15 V
  • AC/DC current measurements
  • Signal Generator with Sine wave up to 100 kHz
  • Oscilloscope Transient Voltage up to 100 kHz
  • Displays activ and reactive impedance components
  • Li-Po battery and micro-USB charging port
  • 1 oz. Weight
  • Backlit LCD display
  • Handles components to a 0201 size (0.3 mm)
  • Gold-plated test leads

Every MPA comes with a hard-shelled carrying case, gold-plated tweezer tips, Offset Calibration Board, and will soon include an NIST traceable calibration certificate. Siborg offers additional accessories including ergonomic bent-tips, LCR-Reader Kelvin Probe Connectors, spare batteries and more.

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