Nov 17, 2025 MVP Introduces the New Carta System that Provides Advanced Inspection and Metrology to Wafer, Diced Wafer, and Bumped Wafer Manufacturers
Hall B2, Booth 112 — Productronica 2025
Vista, California — November 17, 2025 — Machine Vision Products, Inc. (MVP), a world leader in Automated Optical Inspection (AOI) solutions, will unveil its newest innovation, the MVP Carta, at Productronica 2025 in Munich, Hall B2, Booth 112. The Carta extends MVP’s semiconductor portfolio into next-generation inspection of solid wafers, film-frame diced wafers, and bumped wafers for sizes up to 300 mm.
The Carta platform is available in two versions. The semi-automatic configuration is designed for R&D labs, pilot lines, and flexible development environments, supporting both solid wafers and film frames with fast manual loading. The fully automated configuration is engineered for high-volume manufacturing and incorporates an advanced robot handling and alignment for automated loading. Additional industry-standard wafer-handling formats can also be supported, ensuring seamless integration into automated cleanroom workflows.
At the core of the Carta system is a dual-camera optical architecture featuring a high-resolution microscope and an optional infrared (IR) camera for enhanced defect detection, including buried or low-contrast anomalies. Combined with 3D metrology, multi-modal illumination, and AI-driven inspection algorithms, Carta delivers precise identification of contamination, delamination, edge and surface cracks, die-level defects, foreign material, and optional bump inspection for advanced packaging.
“The MVP Carta represents the next step in our commitment to semiconductor customers seeking tighter process control and higher reliability in wafer and die inspection,” said Dr. George Ayoub, President and CEO of Machine Vision Products. “It brings together MVP’s proven AOI technology with enhanced automation and advanced metrology to meet the industry’s most demanding requirements.”
The Carta complements MVP’s expanding portfolio of 3D AOI platforms for semiconductor, packaging, microelectronics, and SMT manufacturing—reinforcing the company’s mission of Build in Quality for the Technology of Tomorrow.
About Machine Vision Products, Inc.
Machine Vision Products, Inc. (MVP) is a global leader in Automated Optical Inspection solutions for semiconductor, advanced packaging, microelectronics, and SMT manufacturing. Founded in 1993 and headquartered in Vista, California, MVP delivers high-performance 2D and 3D inspection platforms designed to meet the most demanding requirements for quality, precision, and process control. With a strong commitment to innovation, MVP’s technology portfolio spans AI-driven defect detection, advanced metrology, flexible automation, and full SEMI-compliant integration. MVP supports customers worldwide
