Aug 25, 2008 Carlsbad, CA 8-25-2008 - Machine Vision Products (MVP), the leader in vision and process control technology, will highlight its Supra M AOI System configured with Flying Color in Booth 1E20. As part of MVP's award-winning line of products, the Supra M offers the flexibility to be configured for 2D or 3D inspection, and be used inline or offline. The Supra M offers low-cost, high performance, advanced inspection capabilities in a smaller footprint (1m conveyor length) with full solder joint inspection and measurement capabilities.
The Supra M will feature the newest ease-of-use features within the iPro software suite. The Supra-M Flying Color compliments MVP's wide range of award winning AOI products and further allows the introduction of flexible solutions with the capability to increase both performance and speed metrics at the same time.
MVP will demonstrate its new ease-of-use ePro design wizard which allows users to easily design even the most complex parts within a matter of seconds with a fully graphical user interface. Scanned images are overlaid with geometry models to facilitate quick and accurate generation of new parts. Integrated with a standard parts library the ePro design wizard allows import of previously designed components and inspection routines as well as the ability to create new parts where default inspection algorithms provide high level of performance.
Utilizing the Auto-Optimize Wizard, users are able to use MVP's latest ease-of-use tool which simplifies algorithm set and optimizes performance with a single utility. The user has confidence in the performance of the inspection parameters as the Auto-Optimize wizard maximizes detection rates to 100% while driving false failures to 0%. Each part type performance can be easily viewed within the Auto-Optimize wizard GUI.
With MVP's newest software enhancements users are now provided with the high-performance inspection capabilities of a rules based system with the ease of use of an image comparison system.
In addition MVP will be demonstrating its Tabletop GEM Compact product with True Color. Electro-optics. The GEM Compact system is modeled after the high performance AutoInspector series, allowing similar advanced capabilities in a tabletop platform. The GEM Series Tabletop has a 50 percent smaller footprint than comparable systems. With full solder joint inspection and measurement capabilities similar to MVP's existing inline systems, it offers an optimized price to performance ratio. Additionally, as an extremely flexible solution, the GEM Series Tabletop has a complete compatibility and program portability with MVP's inline inspection systems.
