Apr 25, 2013 
ViTrox Technologies, a solutions provider of innovative, advanced and cost-effective automated vision inspection systems and equipment for the semiconductor and electronics packaging industries, announces that it has been awarded a 2013 EM Asia Innovation Award in the category of Test & Measurement / Inspection Systems – AXI for its V810 X-ray inspection system. The award was presented to the company during an April 24, 2013 ceremony in Shanghai during NEPCON China.
The V810 X-ray inspection system features new Phase Shift Profileometry (PSP), a ViTrox patented technology for board warpage compensation and 100 percent pin through-hole component PCBs. Additionally, to serve market demands for small scale component inspection, the V810 is now equipped with variable magnification at 11 and 19 micros to provide end-users with better magnified images and resolution on small components such as 01005s and 0.2 mm CSPs.
Winner of four industry awards, the V810 is the latest revolution in X-ray technology inspecting double-sided PCB panels with high defect coverage, high inspection speed and an excellent call rate. The system is designed for in-line and offline use and works on both lead and lead-free solder joints. The V810’s state-of-the-art technology is based on Digital Tomosynthesis methodology and runs on a new platform with Windows 7 Professional 64bit.
Established in 2006, the EM Asia Innovation Awards program strives to recognize and celebrate excellence in the Asian electronics industry, inspiring companies to achieve the highest standards and push the industry forward.
For more information about ViTrox’s V810, visit www.vitrox.com.
