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Test Strategist Presents Defect Level Study and Test Effectiveness

Aug 27, 2007

To design optimal test and inspection strategies, knowledge of industry defect level and test effectiveness are needed. This presentation will share results from the current studies on these two important topics that Agilent Technologies has done together with companies around the world. The presentation includes new data from more than 3.7 billion solder joints, expanding on the widely-reference one-billion solder joint study conducted by Agilent in 1999.

When: September 5, 2007, 10:00am � 11:30am (Pacific Time)

Where: Register here: http://www.smta.org/education/presentations/presentations.cfm#defectstudy

Registration is $75 for SMTA Members and $150 for non members.

Media/ Analysts: For any additional questions about Agilent�s latest work in the test strategy arena, please contact Janet Smith at janet_smith@agilent.com to set up a specific meeting time.

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