Technical Library | 2023-04-17 21:17:59.0
The purpose of this paper is to evaluate and compare the effectiveness and sensitivity of different cleanliness verification tests for post soldered printed circuit board assemblies (PCBAs) to provide an understanding of current industry practice for ionic contamination detection limits. Design/methodology/approach – PCBAs were subjected to different flux residue cleaning dwell times and cleanliness levels were verified with resistivity of solvent extract, critical cleanliness control (C3) test, and ion chromatography analyses to provide results capable of differentiating different sensitivity levels for each test. Findings – This study provides an understanding of current industry practice for ionic contamination detection using verification tests with different detection sensitivity levels. Some of the available cleanliness monitoring systems, particularly at critical areas of circuitry that are prone to product failure and residue entrapment, may have been overlooked. Research limitations/implications – Only Sn/Pb, clean type flux residue was evaluated. Thus, the current study was not an all encompassing project that is representative of other chemistry-based flux residues. Practical implications – The paper provides a reference that can be used to determine the most suitable and effective verification test for the detection of ionic contamination on PCBAs. Originality/value – Flux residue-related problems have long existed in the industry. The findings presented in this paper give a basic understanding to PCBA manufacturers when they are trying to choose the most suitable and effective verification test for the detection of ionic contamination on their products. Hence, the negative impact of flux residue on the respective product's long-term reliability and performance can be minimized and monitored effectively.
Industry News | 2017-01-09 19:39:50.0
Gen3 Systems Limited will exhibit in Booth #3136 with Ascentech, LLC at the 2017 IPC APEX EXPO, scheduled to take place Feb. 14-16, 2017 at the San Diego Convention Center in California. Gen3 and Ascentech will demonstrate the new CM+ Series and AutoSIR 2/AutoCAF 2.
As the leader in precision cleaning, ZESTRON is uniquely positioned to offer you the analytical services and expertise needed to ensure you meet your precision cleaning requirements. Ionic contamination testing, SIR testing, ion chromatography, FTIR
New Equipment | Cleaning Equipment
Zero Ion Ionic Contamination Tester Today's Zero Ion is designed to meet the cleanliness testing challenges associated with modern circuit assemblies. The Zero Ion is capable of extracting and quantifying assembly contamination levels per IPC J STD0
Used SMT Equipment | Board Cleaners
2011 AQ Zero ion board contamination tester available: * 120VAC Power Requirement. * Large Board capacity 24x24 * New OEM All in One Computer with Windows based O/S. * ESD Safe Laminate Work surface with ESD Grounding. *Test Solution (not inclu
Industry News | 2009-10-22 12:44:35.0
RANCHO CUCAMONGA, CA — October 2009 — Aqueous Technologies Corp. announces the video release of the Zero-Ion Ionic Contamination (Cleanliness) Tester. The Zero-Ion G3 represents the next generation of ionic contamination testing systems.
Industry News | 2008-03-20 15:59:15.0
Rancho Cucamonga, CA - March 2008 � Aqueous Technologies Corp. announces that it will feature the Zero-Ion Ionic Contamination (Cleanliness) Tester, which is designed to test electronics assemblies for ionic contamination, in booth 2431 at the upcoming APEX 2008 exhibition and conference scheduled to take place April 1-3, 2008 in Las Vegas.
Industry News | 2009-03-10 17:38:33.0
Rancho Cucamonga, CA - January 2009 � Aqueous Technologies Corp. announces that it will introduce the newly updated Zero-Ion Ionic Contamination (Cleanliness) Tester, which is designed to test electronics assemblies for ionic contamination, in booth 2247 at the upcoming IPC/APEX conference and exhibition, scheduled to take place March 31-April 2, 2009 in Las Vegas.
Industry News | 2011-11-01 10:52:43.0
Aqueous Technologies announces the upcoming 30th anniversary of the Zero-Ion Ionic Contamination (cleanliness) Tester.
Used SMT Equipment | In-Circuit Testers
Aqueous Technologies Zero Ion Ionic Contamination Tester 120V, Year 2011