Full Site - : microscopes (Page 7 of 117)

WA Brown Industrial Sales

Industry Directory | Distributor / Equipment Dealer / Broker / Auctions / Manufacturer / Manufacturer's Representative

Mantis Magnifiers from Vision Eng, Scienscope microscopes, Fancort PCB racks, and ultrasonic cleaners from Branson and Crest Ultrasonics. Veteran Owned Small Business. SMTinspection.com

Meet ERMA, the Enhanced Reality 3D-Like Stereo Microscope

Meet ERMA, the Enhanced Reality 3D-Like Stereo Microscope

Videos

Enhanced Reality Microscope (ERMA) True 3D Digital Viewer Intuitively Designed for You Move your assembly process to the next level with our state-of-the-art, fully integrated digital inspection viewer. Moving away from the traditional models of us

WPI Vision

Inspection Microscopes

Inspection Microscopes

New Equipment | Inspection

Production Automation offers a variety of microscopes from manufacturers like O.C. White, Scienscope, Vision Mantis, Meiji,  and Aven.

Production Automation Corporation

CARTON OPTICAL INDUSTRIES, LTD.

Industry Directory | Manufacturer

Manufacturers of optical goods such as microscopes and loupes for works and inspection

Labtek

Industry Directory |

Supplier of new & used microscopes, custom video & measuring systems, printers, monitors, CCD cameras, and digital & dial gauges.

EF Works Pte Ltd

Industry Directory |

Refurbished test and measurement equipments, Refurbished ATE sales and support, Laboratory microscopes and probecards

Applying Microscopic Analytic Techniques For Failure Analysis In Electronic Assemblies

Technical Library | 2021-09-21 20:36:45.0

The present paper gives an overview of surface failures, internal nonconformities and solders joint failures detected by microscopic analysis of electronic assemblies. Optical microscopy (stereomicroscopy) and Fourier-Transform- Infrared (FTIR) microscopy is used for documentation and failure localization on electronic samples surface. For internal observable conditions a metallographic cross-section analysis of the sample is required. The aim of this work is to present some internal and external observable nonconformities which frequently appear in electronic assemblies. In order to detect these nonconformities, optical microscopy, cross section analysis, FTIR-microscopy and scanning electron microscopy with energy dispersive spectrometry (SEM-EDS) were used as analytical techniques.

ZOLLNER ELECTRONICS, INC.

Leica MZ6 - Stereo Boom Microscope

Leica MZ6 - Stereo Boom Microscope

Used SMT Equipment | Visual Inspection

- 6.3:1 zoom - Magnifications up to 320x (these scopes not yet determined) - Field diameters up to 104.2mm - Working distances of up to 297mm - Constant sharpness throughout the 6.3:1 magnification range (parfocal) - Coarse/fine focusing and motor fo

Automation Equipment


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