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Saki Presents 3D AOI Side-Angle Optics and Lighting Technology at NEPCON Thailand, Booth 6D11 and 6D12

Industry News | 2016-06-19 20:07:24.0

Saki Corporation will present its 3D automated optical inspection (AOI) equipment with innovative side-angle cameras and ring lighting technology at NEPCON Thailand 2016, held June 22-25, 2016, at BITEC in Bangkok, Thailand. Saki's 2D AOI system for simultaneous double-sided PCB inspection will also be on display.

SAKI America

Saki to Demonstrate AOI, SPI, and AXI Software and Systems at IPC APEX Booth 1127

Industry News | 2018-02-26 11:10:21.0

Saki Corporation will demonstrate its new 5th generation, 3D Automated Optical Inspection (AOI), 3D Solder Paste Inspection (SPI), and 3D Automated X-ray Inspection (AXI) systems and software at the IPC APEX Expo, February 27-March 1, San Diego, California, Booth 1127. In addition, Saki's 3D AOI system, based on its Quality-Driven Production (QDP) concept for true closed-loop, machine-to-machine communication, will be part of the Fuji SMART Factory Line in booth 3539.

SAKI America

Machine Vision Products (MVP) AOI Solutions for SMT and SPI Inspection

Machine Vision Products (MVP) AOI Solutions for SMT and SPI Inspection

Videos

Overview of Machine Vision Product's Supra E, Ultra IV and Spectra Automated Optical Inspection Systems.

Machine Vision Products, Inc

Optical Connectivity Secures Gaming and Multimedia Streaming

Industry News | 2020-10-29 06:42:41.0

KDPOF Study Reports Significant Effect of Home Networking on Online Gaming Experience

KDPOF

Causes and Costs of No Fault Found Events

Technical Library | 2016-04-14 13:49:44.0

A system level test, usually built-in test (BIT), determines that one or more subsystems are faulty. These subsystems sent to the depot or factory repair facility, called units under test (UUTs) often pass that test, an event we call No-Fault-Found (NFF). With more-and more electronics monitored by BIT, it is more likely that an intermittent glitch will trigger a call for a maintenance action resulting in NFF. NFFs are often confused with false alarm (FA), cannot duplicate (CNDs)or retest OK (RTOK) events. NFFs at the depot are caused by FAs, CNDs, RTOKs as well as a number of other complications. Attempting to repair NFF scan waste precious resources, compromise confidence in the product, create customer dissatisfaction, and the repair quality remains a mystery. The problem is compounded by previous work showing that most failure indications calling for repair action at the system level are invalid. NFFs can be caused by real failures or may be a result of system level false alarms. Understanding the cause of the problem may help us distinguish between units under test (UUTs) that we can repair and those that we cannot. In calculating the true cost of repair we must account for wasted effort in attempting to repair unrepairable UUTs.This paper will shed some light on this trade-off. Finally, we will explore approaches for dealing with the NFF issue in a cost effective manner.

A.T.E. Solutions, Inc.

Increase Your Process Control and Lower Cost of Ownership

Technical Library | 2012-11-12 14:06:48.0

With consumers constantly looking for lower prices on their technology products and manufacturers trying to squeak out higher margins from their production lines, the need for process control and lower overhead costs have become even more important. One sector that is often overlooked is the hand soldering area of the factory. Many factories have been struggling with antiquated soldering systems for years. In some cases they are trying to make their investment in stations last much longer than they were designed for, or they are falsely trying to recoup their original investment ‐ all at the cost of higher operating expenses or even worse, reduced operator thru‐put.

Metcal

Europlacer to Exhibit at Southern Manufacturing and Electronics Exhibition

Industry News | 2010-01-17 22:29:38.0

DORSET, UNITED KINGDOM - January 2010 - Blakell Europlacer Ltd., a designer and manufacturer of comprehensive SMT placement systems for the global electronics industry, will display a few of its leading product lines on stand 231 at the upcoming Southern Manufacturing and Electronics exhibition, scheduled to take place February 10-11, 2010 in Farnborough, Hants, United Kingdom.

EUROPLACER

Nordson DAGE and Nordson YESTECH to Display X-ray and AOI Systems at NEPCON China

Industry News | 2014-04-16 13:17:25.0

Nordson DAGE and Nordson YESTECH, divisions of Nordson Corporation (NASDAQ: NDSN), announce they will exhibit in Booth # B-1F25 at NEPCON China, scheduled to take place April 23-25, 2014 at the Shanghai World Expo & Exhibition Convention Center (Hall 1) in Shanghai, China.

Nordson DAGE

Saki Incorporates its 3D AOI and SPI Systems into Fuji America's Smart Factory Line

Industry News | 2016-12-01 19:42:40.0

Saki Corporation has partnered with Fuji America to incorporate its 3D automated optical inspection (AOI) and 3D solder paste inspection (SPI) systems into Fuji's Smart Factory SMT line at its Vernon Hills, IL facility. Saki's inspection and measurement systems will be used to ensure that the printed circuit boards produced at Fuji adhere to the highest standards of quality and reliability.

SAKI America

Saki Corporation Exhibits 3D AOI and SPI Systems at SMT Hybrid Packaging

Industry News | 2015-04-21 17:10:49.0

Saki Corporation will demonstrate its BF-3Di automated optical inspection and BF-3Si automated solder paste inspection systems at SMT Hybrid Packaging, Nuremberg, Germany, May 5-7 2015, in Stand 7-331.

SAKI America


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