Used SMT Equipment | In-Circuit Testers
Agilent-Keysight E7922A 4-Port 10/100 Ethernet Routing Card Agilent-Hp E7922A is a 4-Port 10/100 Ethernet Routing Card. By benchmarking a network or router with realistic tests, carriers and equipment manufacturers can be assured that the route
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight E7922A 4-Port 10/100 Ethernet Routing Card Agilent-Hp E7922A is a 4-Port 10/100 Ethernet Routing Card. By benchmarking a network or router with realistic tests, carriers and equipment manufacturers can be assured that the route
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight E7922A 4-Port 10/100 Ethernet Routing Card Agilent-Hp E7922A is a 4-Port 10/100 Ethernet Routing Card. By benchmarking a network or router with realistic tests, carriers and equipment manufacturers can be assured that the route
Industry Directory | Consultant / Service Provider / Manufacturer / Other
We develop produce and supply innovative cost effective thermal control units to major Semiconductor Devices Manufacturers to test IC devices -LOW & HIGH Power devices for temp range -65°C to +200°C.
Industry Directory | Consultant / Service Provider / Standards Setting / Certification / Training Provider
ACI, an authorized IPC Training Center operating the National Electronics Manufacturing Center of Excellence providing analytical testing, manufacturing and repair services to the electronics industry.
New Equipment | Industrial Automation
Want to buy best parts with a competitive price ? Please check it with mailto:unity@mvme.cn! we will response you in 24 hours! Contact: Sandy Lin mailto:unity@mvme.cn Skype: live:onlywnn_1 Telegram:+8618020776786 Mobile(Whatsapp): (+86)-180207
Industry Directory | Consultant / Service Provider
Engelmaier Associates, L.C.is a firm providing consulting services on reliability, manufacturing and
Technical Library | 2016-05-13 11:44:16.0
The process of manufacturing and qualifying IC's consists of many steps while Temperature forcing systems play a crucial role in the final testing process. These environmental tests assure quality and reliability by stressing the device on one hand as well as helping to characterize and validate it on the other hand (making sure manufacturing outcome meets the design requirements). At later stages the temperature testing can support failure analysis effort and root cause analysis. AS common practice we are dealing with few different kinds of temperature forcing systems: Chambers, Thermal Stream systems and Direct Thermal Head systems. In this article I would like to focus on the practical aspects of utilizing Thermal Stream systems and Direct Thermal Head systems.
Technical Library | 2012-12-14 14:28:20.0
This paper examines the potential failure mechanisms that can damage modern lowvoltage CMOS devices and their relationship to electrical testing. Failure mechanisms such as electrostatic discharge (ESD), CMOS latch-up, and transistor gate oxide degradation can occur as a result of electrical over-voltage stress (EOS). In this paper, EOS due to electrical testing is examined and an experiment is conducted using pulsed voltage waveforms corresponding to conditions encountered during in-circuit electrical testing. Experimental results indicate a correlation between amplitude and duration of the pulse waveform and device degradation due to one or more of the failure mechanisms.
New Equipment | Industrial Automation
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