Industry News: bake vertical (Page 1 of 1)

Multitest's UltraFlat™ Process Meets Requirements of High Parallel Vertical Probe Card Applications

Industry News | 2012-01-05 19:20:11.0

Multitest announces that its UltraFlat™ process meets the requirements of high parallel vertical probe card applications.

Multitest Elektronische Systeme GmbH

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