SMTnet Express, December 29, 2016, Subscribers: 30,326, Companies: 15,062, Users: 41,660 Partially-Activated Flux Residue Impacts on Electronic Assembly Reliabilities Yanrong Shi, Ph.D., Kyle Loomis, Jennifer Allen, Bruno Tolla, Ph.D.; Kester
SMTnet Express, March 3, 2016, Subscribers: 24,124, Companies: 15,000, Users: 40,059 Nanocopper Based Paste for Solid Copper Via Fill David Ciufo, Sujatha Ramanujan, Janet Heyen, Michael Carmody; Intrinsiq Materials , Sunny Patel; Candor
SMTnet Express, April 8, 2016, Subscribers: 24,185, Companies: 14,769, Users: 39,976 Streamlining PCB Assembly and Test NPI with Shared Component Libraries Julian Coates; Mentor Graphics PCB assembly designs become more complex year-on-year, yet
SMTnet Express, July 21, 2016, Subscribers: 25,754, Companies: 14,875, Users: 40,740 The Effects of PCB Fabrication on High-Frequency Electrical Performance John Coonrod; Rogers Corporation, Advanced Circuit Materials Division Achieving optimum
SMTnet Express, August 11, 2016, Subscribers: 26,064, Members: Companies: 14,906, Users: 40,872 New Approaches to Develop a Scalable 3D IC Assembly Method Charles G. Woychik Ph.D. Sangil Lee, Ph.D., Scott McGrath, Eric Tosaya and Sitaram Arkalgud
SMTnet Express, February 4, 2016, Subscribers: 24,087, Members: Companies: 14,964, Users: 39,872 Make the Right Design Choices in Load Switching and Simulation in a High Current and Mechatronic Functional Test Derek Ong, Lok Teng Kee, Chuah Rhun
SMTnet Express, November 3, 2016, Subscribers: 26,550, Companies: 15,009, Users: 41,360 A Novel Method for the Fabrication of a High-Density Carbon Nanotube Microelectrode Array Adam Khalifa, Zhaoli Gao, Amine Bermak, Yi Wang, Leanne Lai Hang Chan
SMTnet Express, November 10, 2016, Subscribers: 26,5620, Companies: 15,019, Users: 41,389 Corrosion Resistant Servers for Free-Air Cooling Data Centers Qiujiang Liu; Baidu, Inc., Prabjit Singh; IBM Corporation This paper describes a corrosion
SMTnet Express, December 7, 2016, Subscribers: 27,507, Companies: 15,035, Users: 41,441 Understanding the Effect of Process Changes and Flux Chemistry on Mid-Chip Solder Balling Katherine Wilkerson, Ian J. Wilding, Michael Carter, Daniel Buckland