SMTnet Express, April 14, 2016, Subscribers: 24,224, Companies: 14,786, Users: 40,027 Causes and Costs of No Fault Found Events Louis Y. Ungar; A.T.E. Solutions, Inc. A system level test, usually built-in test (BIT), determines that one or more
SMTnet Express, August 23, 2018, Subscribers: 31,271, Companies: 11,024, Users: 25,118 Board-Level Thermal Cycling and Drop-Test Reliability of Large, Ultrathin Glass BGA Packages for Smart Mobile Applications Bhupender Singh, Gary Menezes, Scott
SMTnet Express, November 4, 2021, Subscribers: 26,512, Companies: 11,460, Users: 26,912 Fabrication Of Solderable Intense Pulsed Light Sintered Hybrid Copper For Flexible Conductive Electrodes Additively printed circuits provide
Head-in-Pillow BGA Defects Head-in-Pillow BGA Defects. Head-in-pillow (HiP), also known as ball-and-socket, is a solder joint defect where the solder paste deposit wets the pad, but does not fully wet the ball. This results in a solder joint
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