Manufacture and distributor full line of Static Control products - instrumentation - data acquisition- charge measurement and event detectors - lab coats - wrist straps - heel grounders - matting - surveys - ionization - ESD packaging -
New Equipment | Test Equipment
The Agilent 81634B optical power sensor is the right choice for accurate power measurements on fiber optic devices. The modular sensor fits into all Agilent 816x Lightwave mainframes and can be used singly or in multiples for parallel measurements of
VJ Electronix leads the way in providing robust and practical X-ray solutions to solve real production issues. Innovation and simplicity govern system design to maximize ease-of-use with programmed inspection and a simple 1–2–Go! user int
Electronics Forum | Tue Jun 04 20:47:10 EDT 2002 | russ
A company I used to work for did not use wrist straps in some areas for the same reason. We had a conductive floor (not dissipative wax) and ESD shoes and heel straps that we tested three times a day. If you can ensure that feet are always on the fl
Electronics Forum | Thu Apr 28 17:02:07 EDT 2011 | grasso1976
Has anyone had success utilizing the lifted lead/ height checker feature on a Mirtec MV-7L. We recently had two separate events where the machine did not detect a lifted lead using the ic/bridge inspector. The soldering results came back with out def
Used SMT Equipment | In-Circuit Testers
104 dB in 1 Hz RBW DANL: 160 dBm in 1 Hz RBW @ 1 GHz preamp On Phase Noise: 100 dBc/Hz @ 10 kHz offset at 1 GHz Frequency Accuracy: +/- 25 ppb with GPS On 1 Hz to 10 MHz Resolution Bandwidth (RBW) Traces: Normal, Max Hold, Min Hold, Average, # o
Used SMT Equipment | General Purpose Test & Measurement
Key Features & Specifications Polarization dependence of Power uncertainty of ±3% Power range from +10 to -80dBm Wavelength range 800 nm – 1650 nm Dual InGaAs detector for low noise and low wavelength dependence Description Keysight's 8163
Industry News | 2012-12-20 19:01:46.0
SMART Group,announces that it will present the webinar “100 Years of X-ray Advancement” on Tuesday, 29 January, 2013, at 2:30 p.m. (GMT).
Industry News | 2011-09-26 16:59:34.0
Nordson DAGE announces that Dr. David Bernard, Product Manager – X-ray Systems, will present a paper titled “The Implications of Recent Technology Advances for X-Ray Inspection in Electronics” at the upcoming SMTA International Conference & Exhibition.
Training Courses | | | ESD Control Training Courses
Browse training and certification programs for electrostatic discharge (ESD) control in electronics assembly.
Events Calendar | Mon Nov 25 00:00:00 EST 2019 - Mon Nov 25 00:00:00 EST 2019 | ,
Webinar: Overcoming Challenging X-Ray Problems
SMTnet Express, January 31, 2019, Subscribers: 31,643, Companies: 10,701, Users: 25,678 Novel Pogo-Pin Socket Design for Automated Low Signal Linearity Testing of CT Detector Sensor Credits: General Electric Due to the arrayed nature
ASYMTEK Products | Nordson Electronics Solutions | https://www.nordson.com/en/divisions/dage/about/news/live-demonstrations-on-nordson-inspection-systems-at-apex
. 14-16, 2017 at the San Diego Convention Center in California. Test and inspection solutions from Nordson DAGE, Nordson MATRIX and Nordson YESTECH will be demonstrated at the event. Nordson DAGE’s flagship system – the new Quadra™ 7 with
Heller Industries Inc. | https://hellerindustries.com/wp-content/uploads/2018/07/last-will-of-bga-void.pdf
Logger GL220 temperature acquisition unit. Figure 13. Thermal Profile The continuity of the components was continuously monitored throughout thermal cycle testing by an event detector in accordance with the IPC-9701 specification. Each component was