Full Site - : motorola electronic (Page 14 of 315)

ASSETR Joins Mentor OpenDoor Program to ensure JTAG interoperability

Industry News | 2008-05-18 02:32:03.0

Richardson, TX (May 13, 2008) - ASSET InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has joined the Mentor Graphics OpenDoor Program in order to ensure toolset interoperability for embedded instrumentation applications. Through the program ASSET and Mentor will enable the exchange of data between Mentor's chip-level inserted design-for-test (DFT) structures, such as the JTAG infrastructure, and ASSET's ScanWorks platform, which automates, accesses and analyzes embedded instrumentation and DFT data.

ASSET InterTech, Inc.

ASSET works with Cadence to drive embedded instrumentation for deep analysis of

Industry News | 2008-06-12 21:49:07.0

ScanWorks� integration into Cadence Encounter Digital IC Design Flow to provide deeper view into complex, packaged chips

ASSET InterTech, Inc.

Multi-function JTAG Module Addresses Analogue Testing JTAG Technologies launches the JT 2149/DAF I/O module for digital and analogue measurement

Industry News | 2012-06-20 14:00:03.0

JTAG Technologies, has introduced the JT 2149/DAF, a compact, mixed-signal (Digital/Analogue/Frequency) measurement module. The JT 2149/DAF is the first unit of its type to offer both digital and analogue test access to PCBs via JTAG Technologies’ widely-used QuadPod signal conditioning interface.

JTAG Technologies B. V.

Preview for JTAG Technologies for the Embedded World, Nuremberg February 26th -28th 2013, Booth 4-617, Hall 4

Industry News | 2012-12-28 20:12:14.0

JTAG Technologies will showcase the following JTAGLive products as well as brand new systems upgrades in Hall 4, booth 617.

JTAG Technologies B. V.

Preview for JTAG Technologies for Embedded World, Nuremberg Hall 4, booth 578

Industry News | 2016-02-08 20:54:11.0

Boundary Scan Market Leader, JTAG Technologies invites you to join us at Embedded World in Nuremberg to discuss two hot board test topics; Design for Testability (DfT) and Optimise your ATE.

JTAG Technologies B. V.

Editors | Preview for Embedded World Nuremberg for JTAG Technologies, Booth 4, 578

Industry News | 2016-02-15 10:17:14.0

Boundary Scan Market Leader, JTAG Technologies invites client to join them at Embedded World in Nuremberg to discuss two hot board test topics.

3M Electrical Solutions Division

Map your JTAG Test Access with Altium Designer

Industry News | 2016-11-09 18:32:18.0

JTAG Technologies, the leading specialist in JTAG/boundary-scan solutions for board testing and device programming are excited to introduce their new collaborative product with Altium – JTAG Maps.

JTAG Technologies B. V.

ASSET's ScanWorks� Supports On-Chip Evaluation of Avago Technologies' ASICs

Industry News | 2008-08-22 17:03:42.0

Richardson, TX (August 19, 2008 � Intel Developers Forum, Booth No. 356)�ASSET� InterTech (www.asset-intertech.com) today announced that it has reached an agreement under which ScanWorks, the company's platform for open embedded instrumentation tools, will support Avago Technologies' embedded instrumentation technology for applications-specific integrated circuits

ASSET InterTech, Inc.

JTAG Technologies Targets Functional Testers

Industry News | 2011-09-12 15:45:51.0

JTAG Technologies is pleased to announce the immediate release of a new JTAG/boundary-scan hardware interface product compatible with the MAC-Panel ‘Scout’ mass interconnect system. The JT 2147/DAK is a signal conditioning module that allows seamless connections from JTAG Technologies PXI DataBlaster to the Scout’s connection system.

JTAG Technologies B. V.

Preview for JTAG Technologies for AUTOTESTCON Schaumburg

Industry News | 2013-08-16 13:32:21.0

JTAG Technologies will be showcasing their latest software and hardware solutions at AUTOTESTCON 2013 Chicago.

JTAG Technologies B. V.


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