Whether you need us to design a complete test solution or you have an existing procedure already in place, ACD has the expertise you require. Flying Probe Test Flying probe test is instrumental in giving our customers confidence in receiving a qual
New Equipment | Test Equipment
The JT 37x7/RMI (rack mountable instrument) consists of a fully featured DataBlaster boundary-scan controller, equipped with four TAPs, plus 256 DIOS I/O channels, all packaged in a convenient 1U, 19-inch rack-mount unit. The RMI is ideal for use in
Tessent combines features of deterministic scan testing, embedded pattern compression, built-in self test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. The Tessent product suit
ChipVORX is a new in-system technology for the configuration and control of chip embedded test, debug, and programming functions In its core ChipVORX is based on the utilization of a new communication interface in the software platform SYSTEM CASCON
During the development of the CION™ technology, GOEPEL electronic focused on customer recommendations for a new generation of economical, yet flexible JTAG/Boundary Scan modules for installation into active test fixtures. Utilizing the unique CION™ t
JTAG/Boundary Scan as an innovative DfT method requires respective scanable components on the unit under test (UUT) for its application. Yet, this cannot always sufficiently be realized in practice, as, for example, edge connectors do not provide suc
Stand-alone Service Fast Turnaround Time Hand or Machine Builds Materials Procurement or Build from Free Issue Kit Engineering Consultation – Design for Manufacture and Test Reporting Extensive Testing Capability including: JTAG Boundary Scan, O
New Equipment | Test Equipment
A high percentage of boards that are tested using in-circuit testers (ICT), have boundary scan devices. These components may have individual JTAG port access or be connected in a chain, sharing common TCK and TMS signals. Since communication with the
New Equipment | Test Equipment
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying pr
New Equipment | Test Equipment - Bond Testers
TR5001T SII TINY is a new generation of TRI's Tiny In-Circuit Tester. Offering up to 640 testing points and extending coverage with Boundary Scan, the TR5001T SII TINY brings an extended ICT feature set in the industry's most compact and affordable s
.gif)
