Overview of Quality and Reliability Issues in the National Technology Roadmap for Semiconductors
Published: |
August 5, 1999 |
Author: |
Barpoulis, Dino |
Abstract: |
This document is an update to the 1994 Quality and Reliability Roadmap issued in support of the 1994 National Technology Roadmap for Semiconductors. This report revisits the challenges, constraints, priorities, and research needs pertaining to quality and reliability issues. It also provides key project proposals that must be implemented to address concerns about reliability attainment and defect learning. An expanded section on test-to-test, diagnostics, and failure analysis; an edited version of the Product Analysis Forum Roadmap; and an appendix containing a draft report highlighting reliability issues is included.... |
You must be a registered user to talk back to us. |
Company Information:
- Aug 05, 1999 - The Effects of Ergonomic Stressors on Process Tool Maintenance and Utilization
- Aug 05, 1999 - Facility Fluids Metrics and Test Methods
- Aug 05, 1999 - Silicon Test Wafer Specification for 180 nm Technology
- Aug 05, 1999 - Test Structures for Benchmarking the Electrostatic Discharge (ESD) Robustness of CMOS Technologies
- Aug 05, 1999 - Guide for the Design of Semiconductor Equipment to Meet Voltage Sag Immunity Standards
- See all SMT / PCB technical articles from SEMATECH »
More SMT / PCB assembly technical articles »
- Aug 20, 2024 - Thermal Interface Materials Drive Electronic Innovation | GPD Global
- Aug 20, 2024 - Underfill Materials Dispensing in Electronics Manufacturing Applications | GPD Global
- Jul 15, 2024 - Transforming LED Manufacturing: I.C.T Engineers Set Up Complete Production Line in Tajikistan | I.C.T ( Dongguan ICT Technology Co., Ltd. )
- Jun 20, 2024 - Case study: Precise Coating on Electronic Hearing Devices | ASYMTEK Products | Nordson Electronics Solutions
- Mar 19, 2024 - What is Underfill | GPD Global
- Browse Technical Library »
Overview of Quality and Reliability Issues in the National Technology Roadmap for Semiconductors article has been viewed 888 times