AOI-AXI Duo Improves Product Yield
Published: |
August 26, 2009 |
Author: |
David Upton |
Abstract: |
Automated optical inspection (AOI) and automated X-ray inspection (AXI) have been around for some time in various configurations and both have played a role in improving the quality of circuit boards. While some companies opt for one technology over the other, each form of inspection contributes its own unique benefit to the manufacturing process.... |
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