Reliability Screening of Lower Melting Point Pb-Free Alloys Containing Bi
Published: |
July 1, 2015 |
Author: |
Joseph M. Juarez, Michael Robinson, Joel Heebink; Honeywell, Polina Snugovsky, Eva Kosiba, Jeffrey Kennedy, Zohreh Bagheri, Subramaniam Suthakaran, Marianne Romansky; Celestica. |
Abstract: |
Aerospace and military companies continue to exercise RoHS exemptions and to intensively research the long term attachment reliability of RoHS compliant solders. Their products require higher vibration, drop/shock performance, and combined-environment reliability than the conventional SAC305 alloy provides. The NASA-DoD Lead-Free Electronics Project confirmed that pad cratering is one of the dominant failure modes that occur in various board level reliability tests, especially under dynamic loading. One possible route to improvement of the mechanical and thermo-mechanical properties of solder joints is the use of Pb-free solders with lower process temperatures. Lower temperatures help reduce the possibility of damaging the boards and components, and also may allow for the use of lower Tg board materials which are less prone to pad cratering defects. There are several Sn-Ag-Bi and Sn-Ag-Cu-Bi alloys which melt about 10°C lower than SAC305. The bismuth in these solder compositions not only reduces the melting temperature, but also improves thermo-mechanical behavior. An additional benefit of using Bi-containing solder alloys is the possibility to reduce the propensity to whisker growth... |
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