Process Control of Ionic Contamination Achieving 6-Sigma Criteria in The Assembly of Electronic Circuits
Published: |
November 29, 2018 |
Author: |
P. Eckold, M. Routley, L. Henneken, G. Naisbitt, R. Fritsch, U. Welzel |
Abstract: |
Ionic contamination testing as a process control tool a newly developed testing protocol based on IPC-TM 650 2.3.25, was established to enable monitoring of ionic contamination within series production. The testing procedure was successfully implemented within the production of high reliability, safety critical electronic circuits, involving multiple production sites around the world. I will be shown in this paper that the test protocol is capable for meeting Six-Sigma-Criteria.... |
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