Guide for the Design of Semiconductor Equipment to Meet Voltage Sag Immunity Standards
Published: |
August 5, 1999 |
Author: |
Mark Stephens, Dennis Johnson, John Soward, Jim Ammenheuser |
Abstract: |
This document summarizes the finding of testing to determine the immunity of semiconductor equipment to voltage sag events. Based in part on the findings, global standards have been adopted to define voltage sag immunity requirements for semiconductor equipment...... |
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